Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region (2008)
Fonte: AIP Conference Proceedings. Nome do evento: IAEA Techinical Meeting on Research Using Small Fusion Devices. Unidade: IF
Assunto: TOKAMAKS
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MACHIDA, Munemasa et al. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region. AIP Conference Proceedings. New York: The Institute. Disponível em: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal. Acesso em: 28 abr. 2024. , 2008APA
Machida, M., Daltrini, A. M., Severo, J. H., Nascimento, I. C., Sanada, E. K., Elizondo, J. I., et al. (2008). Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region. AIP Conference Proceedings. New York: The Institute. Recuperado de http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normalNLM
Machida M, Daltrini AM, Severo JH, Nascimento IC, Sanada EK, Elizondo JI, Kuznetsov YK, Galvao RMO. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region [Internet]. AIP Conference Proceedings. 2008 ; 996 235-240.[citado 2024 abr. 28 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normalVancouver
Machida M, Daltrini AM, Severo JH, Nascimento IC, Sanada EK, Elizondo JI, Kuznetsov YK, Galvao RMO. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region [Internet]. AIP Conference Proceedings. 2008 ; 996 235-240.[citado 2024 abr. 28 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal
